- laser-beam induced current
- струм, наведений лазерним випромінюванням
English-Ukrainian dictionary of microelectronics. 2013.
English-Ukrainian dictionary of microelectronics. 2013.
Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… … Wikipedia
Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s … Wikipedia
Laser — For other uses, see Laser (disambiguation). United States Air Force laser experiment … Wikipedia
Laser diode — Top: a packaged laser diode shown with a penny for scale. Bottom: the laser diode chip is removed from the above package and placed on the eye of a needle for scale … Wikipedia
Thermal laser stimulation — represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. [Harvnb|Beaudoin|Desplats|Perdue|Boit|2004] This technique may be used for semiconductor failure analysis. There are… … Wikipedia
Nd:YAG laser — with lid open showing frequency doubled 532 nm green light Nd:YAG laser rod … Wikipedia
Electromagnetically induced transparency — The effect of EIT on a typical absorption line. A weak probe normally experiences absorption shown in blue. A second coupling beam induces EIT and creates a window in the absorption region (red). This plot is a computer simulation of EIT in an… … Wikipedia
Laboratory for Laser Energetics — LLE redirects here. For other uses, see LLE (disambiguation). Laboratory for Laser Energetics Motto A unique national resource … Wikipedia
Light induced voltage alteration — (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the generation of electron hole pairs in… … Wikipedia
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
Failure analysis — is the process of collecting and analyzing data to determine the cause of a failure. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of… … Wikipedia